Single-interferogram wide-field Bayesian analysis for geometrical characterization of nanophotonic elements

Authors: Damian Suski, Maria Cywińska, Julianna Winnik et al.
Publication: Nanophotonics XI
Published: May 29, 2026
Source: Crossref
Back to Search View Original Cite This Article

Related Articles

Implementation of a statistical-based compressive sensing method in Hadamard-based single-pixel microscopy

Samuel Ignacio Zapata-Valencia, Heberley Tobón-Maya et al. - May 2026

Read More
Probing external environment with nanoparticle-doped optical fiber based on interaction between evanescent field and surrounding medium

Apolline Legrand, Wilfried Blanc et al. - May 2026

Read More
Optofluidic sensors based on surface-enhanced Raman spectroscopy for sensitive detection of pesticides in the field

Elizaveta Vereshchagina, Simone Zonetti et al. - May 2026

Read More
Single-shot volumetric additive manufacturing via computer generated holograms (CGH)

Junhee Lee, Lovish Gulati et al. - May 2026

Read More
Single-shot common-path grating-based holographic microscopy

Aleksandra Piekarska, Mikołaj Rogalski et al. - May 2026

Read More